JH

Jens Heinrich

Globalfoundries: 29 patents #87 of 4,424Top 2%
PC Phoenix Contact: 4 patents #121 of 624Top 20%
SA Siemens Aktiengesellschaft: 3 patents #4,667 of 22,248Top 25%
VG Vitesco Technologies Germany Gmbh: 2 patents #3 of 88Top 4%
BC Bayer Cropscience: 1 patents #635 of 1,202Top 55%
AM AMD: 1 patents #5,683 of 9,279Top 65%
TG Tyco Electronics Amp Gmbh: 1 patents #91 of 276Top 35%
UK Umicore Ag & Co. Kg: 1 patents #243 of 444Top 55%
JT Johnson Controls Technology: 1 patents #994 of 2,110Top 50%
📍 Sinzing, DE: #3 of 68 inventorsTop 5%
Overall (All Time): #66,241 of 4,157,543Top 2%
44
Patents All Time

Issued Patents All Time

Showing 26–44 of 44 patents

Patent #TitleCo-InventorsDate
8436425 SOI semiconductor device comprising substrate diodes having a topography tolerant contact structure Kai Frohberg, Kerstin Ruttloff 2013-05-07
8383510 Semiconductor device comprising metallization layers of reduced interlayer capacitance by reducing the amount of etch stop materials Torsten Huisinga, Ralf Richter, Ronny Pfuetzner 2013-02-26
8367504 Method for forming semiconductor fuses in a semiconductor device comprising metal gates Ralf Richter, Kai Frohberg 2013-02-05
8344151 Process for the preparation of 4-aminobut-2-enolides starting from 4-alkoxyfuran-2(5H)-one or 4-arylalkoxyfuran-2(5H)-one Norbert Lui 2013-01-01
8338306 Forming semiconductor resistors in a semiconductor device comprising metal gates by increasing etch resistivity of the resistors Ralf Richter, Katja Steffen, Johannes Groschopf, Frank Seliger, Andreas Ott +2 more 2012-12-25
8329526 Cap removal in a high-k metal gate electrode structure by using a sacrificial fill material Frank Seliger, Ralf Richter, Markus Lenski 2012-12-11
8216928 Methods for fabricating semiconductor devices having local contacts Ralf Richter, Torsten Huisinga 2012-07-10
8182709 CMP system and method using individually controlled temperature zones Gerd Marxsen 2012-05-22
8183139 Reduced defectivity in contacts of a semiconductor device comprising replacement gate electrode structures by using an intermediate cap layer Gerd Marxsen 2012-05-22
8138038 Superior fill conditions in a replacement gate approach by performing a polishing process based on a sacrificial fill material Gerd Marxsen, Katja Steffen 2012-03-20
8048726 SOI semiconductor device with reduced topography above a substrate window area Kai Frohberg, Sven Mueller, Kerstin Ruttloff 2011-11-01
7985668 Method for forming a metal silicide having a lower potential for containing material defects Ralf Richter, Torsten Huisinga 2011-07-26
7951677 Corner rounding in a replacement gate approach based on a sacrificial fill material applied prior to work function metal deposition Thomas Werner, Frank Seliger, Frank Richter 2011-05-31
7905764 Polishing head using zone control Gerd Marxsen 2011-03-15
6140895 Electromagnetic relay Michael Dittmann, Martin Hanke 2000-10-31
6118359 Polarized electromagnetic relay Michael Dittmann, Heinz Stadler 2000-09-12
6081176 Electromagnetic relay Michael Dittmann, Rainer Vogel, Titus Ziegler 2000-06-27
6002312 Electromagnetic relay Michael Dittmann, Heinz Stadler 1999-12-14
5734308 Electromagnetic monostable small relay Michael Dittmann 1998-03-31