DD

Derya Deniz

Globalfoundries: 8 patents #444 of 4,424Top 15%
QU Qorvo Us: 8 patents #59 of 457Top 15%
Overall (All Time): #286,219 of 4,157,543Top 7%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
12388407 Method for manufacturing acoustic devices with improved performance Buu Q. Diep, Matthew Wasilik, John Belsick 2025-08-12
12365979 Piezoelectric bulk layers with tilted c-axis orientation and methods for making the same Matthew Wasilik, Robert Kraft, John Belsick 2025-07-22
12031949 Preventing epoxy bleed-out for biosensor devices Buu Q. Diep, John Belsick, Matthew Wasilik, Rio Rivas, Bang Nguyen 2024-07-09
11990885 Method for manufacturing acoustic devices with improved performance Buu Q. Diep, Matthew Wasilik, John Belsick 2024-05-21
11885007 Piezoelectric bulk layers with tilted c-axis orientation and methods for making the same Matthew Wasilik, Robert Kraft, John Belsick 2024-01-30
11824511 Method for manufacturing piezoelectric bulk layers with tilted c-axis orientation Robert Kraft, John Belsick 2023-11-21
11401601 Piezoelectric bulk layers with tilted c-axis orientation and methods for making the same Matthew Wasilik, Robert Kraft, John Belsick 2022-08-02
11381212 Piezoelectric bulk layers with tilted c-axis orientation and methods for making the same Robert Kraft, John Belsick 2022-07-05
9583397 Source/drain terminal contact and method of forming same Benjamin G. Moser, Sunit S. Mahajan, Domingo A. Ferrer Luppi 2017-02-28
9117930 Methods of forming stressed fin channel structures for FinFET semiconductor devices Vimal Kamineni, Abner Bello, Abhijeet Paul, Robert J. Miller, William J. Taylor, Jr. 2015-08-25
9076787 Fabrication of nickel free silicide for semiconductor contact metallization 2015-07-07
8975142 FinFET channel stress using tungsten contacts in raised epitaxial source and drain Abhijeet Paul, Abner Bello, Vimal Kamineni 2015-03-10
8912057 Fabrication of nickel free silicide for semiconductor contact metallization 2014-12-16
8889500 Methods of forming stressed fin channel structures for FinFET semiconductor devices Vimal Kamineni, Abner Bello, Abhijeet Paul, Robert J. Miller, William J. Taylor, Jr. 2014-11-18
8859368 Semiconductor device incorporating a multi-function layer into gate stacks 2014-10-14
8580686 Silicidation and/or germanidation on SiGe or Ge by cosputtering Ni and Ge and using an intralayer for thermal stability 2013-11-12