Issued Patents All Time
Showing 1–25 of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11965856 | Method and device for detecting metal residue in electric-resistance-welded steel pipe | Toshiyuki Suzuma | 2024-04-23 |
| 11193910 | Device and method of detecting magnetic characteristic change for long material | Toshiyuki Suzuma, Yoshiyuki Ota | 2021-12-07 |
| 10416123 | Flaw detection sensitivity adjustment method and abnormality diagnosis method for ultrasonic probe | Masaki Yamano, Shigetoshi Hyodo, Masaki Tanaka, Tsukasa Suda | 2019-09-17 |
| 9559058 | Semiconductor device and method for manufacturing the same | Masaki Haneda, Michie Sunayama, Noriyoshi Shimizu, Nobuyuki Ohtsuka, Takahiro Tabira | 2017-01-31 |
| 9291599 | Magnetic testing method and apparatus | Toshiyuki Suzuma, Makoto Sakamoto, Yoshiyuki Oota | 2016-03-22 |
| 9121833 | Defect inspecting apparatus | Kazunori Anayama, Toshiyuki Suzuma, Masami Ikeda, Kenta Sakai | 2015-09-01 |
| 8803516 | Eddy current testing method and apparatus for inspecting an object for flaws | Takashi Hibino, Takashi Fujimoto, Keisuke Komatsu, Makoto Takata, Makoto Sakamoto | 2014-08-12 |
| 8685265 | Manufacturing method of semiconductor device and semiconductor manufacturing apparatus | Kazuo Hashimi | 2014-04-01 |
| 8638091 | Rotary eddy current testing probe device | Takashi Hibino, Takashi Fujimoto, Shigeki Namekata, Keisuke Komatsu, Makoto Takata +1 more | 2014-01-28 |
| 8552717 | Eddy current testing method and eddy current testing apparatus | Shigetoshi Hyodo | 2013-10-08 |
| 8497208 | Semiconductor device and method for manufacturing the same | Michie Sunayama, Noriyoshi Shimizu | 2013-07-30 |
| 8168532 | Method of manufacturing a multilayer interconnection structure in a semiconductor device | Masaki Haneda, Michie Sunayama, Noriyoshi Shimizu, Nobuyuki Ohtsuka, Takahiro Tabira | 2012-05-01 |
| 8104349 | Flaw detection tracking device for pipe or tube and automatic flaw detecting apparatus for pipe or tube using the same | Hiroshi Kubota, Masami Ikeda, Nobuyuki Mori, Hiroshi Sato | 2012-01-31 |
| 8071474 | Method of manufacturing semiconductor device suitable for forming wiring using damascene method | Noriyoshi Shimizu, Nobuyuki Ohtsuka, Hideki Kitada | 2011-12-06 |
| 8067309 | Semiconductor device using metal nitride as insulating film and its manufacture method | Noriyoshi Shimizu, Hiroki Kondo, Takashi Suzuki, Nobuyuki Nishikawa | 2011-11-29 |
| 8067836 | Semiconductor device with reduced increase in copper film resistance | Masaki Haneda, Noriyoshi Shimizu, Nobuyuki Ohtsuka, Michie Sunayama, Takahiro Tabira | 2011-11-29 |
| 8027796 | S/N ratio measuring method in eddy current testing on internal surface of pipe or tube | Shoji Kinomura, Toshiya Kodai, Shugo Nishiyama | 2011-09-27 |
| 7935624 | Fabrication method of semiconductor device having a barrier layer containing Mn | Nobuyuki Ohtsuka, Noriyoshi Shimizu, Hisaya Sakai | 2011-05-03 |
| 7846833 | Manufacture method for semiconductor device suitable for forming wirings by damascene method and semiconductor device | Hideki Kitada, Nobuyuki Ohtsuka, Noriyoshi Shimizu | 2010-12-07 |
| 7816279 | Semiconductor device and method for manufacturing the same | Michie Sunayama, Noriyoshi Shimizu | 2010-10-19 |
| 7713869 | Manufacture method for semiconductor device suitable for forming wirings by damascene method and semiconductor device | Hideki Kitada, Nobuyuki Ohtsuka, Noriyoshi Shimizu | 2010-05-11 |
| 7507666 | Manufacture method for semiconductor device having concave portions filled with conductor containing Cu as its main composition | Hideki Kitada, Nobuyuki Ohtsuka, Noriyoshi Shimizu | 2009-03-24 |
| 7507659 | Fabrication process of a semiconductor device | Nobuyuki Ohtsuka, Noriyoshi Shimizu | 2009-03-24 |
| 7413977 | Method of manufacturing semiconductor device suitable for forming wiring using damascene method | Noriyoshi Shimizu, Nobuyuki Ohtsuka, Hideki Kitada | 2008-08-19 |
| 7256500 | Semiconductor device using metal nitride as insulating film | Noriyuki Shimizu, Hiroki Kondo, Takashi Suzuki, Nobuyuki Nishikawa | 2007-08-14 |