Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10416123 | Flaw detection sensitivity adjustment method and abnormality diagnosis method for ultrasonic probe | Masaki Yamano, Yoshiyuki Nakao, Shigetoshi Hyodo, Masaki Tanaka | 2019-09-17 |