Issued Patents All Time
Showing 51–75 of 157 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8073011 | Pseudo base station apparatus | Keiji Kameda, Nobumitsu Umezawa, Olivier Genound | 2011-12-06 |
| 8072592 | Reticle defect inspection apparatus and reticle defect inspection method | Riki Ogawa | 2011-12-06 |
| 7911599 | Reticle defect inspection apparatus and reticle defect inspection method | Riki Ogawa | 2011-03-22 |
| 7906186 | Ink jet recording medium | Hiroshi Yamamoto, Taihei Noshita, Kouichi Sasaki | 2011-03-15 |
| 7760349 | Mask-defect inspecting apparatus with movable focusing lens | Akihiko Sekine, Ikunao Isomura, Shinji Sugihara, Riki Ogawa | 2010-07-20 |
| 7727597 | Method and apparatus for preparing thin film | Eizo Watanabe, Masato Sone, Yoshinori Matsuoka, Hideo Miyake, Masayasu Iida | 2010-06-01 |
| 7709987 | Magneto rotor | Reiji Sato | 2010-05-04 |
| 7688077 | Test system and daughter unit | Kouji Miyauchi | 2010-03-30 |
| D606837 | Cutter knife | — | 2009-12-29 |
| 7551767 | Pattern inspection apparatus | Hideo Tsuchiya, Kyoji Yamashita, Ikunao Isomura, Toru Tojo, Yasushi Sanada | 2009-06-23 |
| 7551273 | Mask defect inspection apparatus | Akihiko Sekine, Ikunao Isomura, Shinji Sugihara, Riki Ogawa | 2009-06-23 |
| 7524546 | Thermal insulating material and pollution control device using the same | Takuma Aizawa, Toshihiro Kasai, Takayuki Kawai | 2009-04-28 |
| 7522276 | Pattern inspection method | Toru Tojo, Ikunao Isomura, Akihiko Sekine | 2009-04-21 |
| 7516203 | Network control verification system, control communication terminal, server apparatus, and network control verification method | Takashi Kitajima, Katsutoshi Sakao, Yasunori Matsui, Hirokatsu Kimata, Satoru Maeda | 2009-04-07 |
| 7488227 | Outboard engine unit | Akifumi Fujima, Koji Kuriyagawa | 2009-02-10 |
| 7461111 | Method of uniforming physical random number and physical number generation device | Hiroyasu Yamamoto, Ananda Vithanage, Takakuni Shimizu, Kaoru Fujita, Hatsumi Nakano +4 more | 2008-12-02 |
| 7421109 | Pattern inspection apparatus | Hideo Tsuchiya, Kyoji Yamashita, Ikunao Isomura, Toru Tojo, Yasushi Sanada | 2008-09-02 |
| 7415149 | Pattern inspection apparatus | Hideo Tsuchiya, Kyoji Yamashita, Ikunao Isomura, Toru Tojo, Yasushi Sanada | 2008-08-19 |
| D571840 | Digital camera | Satoshi Fujiwara | 2008-06-24 |
| 7379176 | Mask defect inspection apparatus | Akihiko Sekine, Ikunao Isomura, Shinji Sugihara, Riki Ogawa | 2008-05-27 |
| 7372560 | Pattern inspection apparatus | Toru Tojo, Ikunao Isomura, Akihiko Sekine | 2008-05-13 |
| D565382 | Utility knife | — | 2008-04-01 |
| 7261864 | Catalyst carrier holding material and catalytic converter | — | 2007-08-28 |
| 7209584 | Pattern inspection apparatus | Hideo Tsuchiya, Shinji Sugihara, Kyoji Yamashita, Kazuhiro Nakashima | 2007-04-24 |
| 7103268 | Optical disk reproducer | — | 2006-09-05 |