KT

Kanetake Takasaki

Fujitsu Limited: 20 patents #1,402 of 24,456Top 6%
Overall (All Time): #225,786 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #TitleCo-InventorsDate
6984267 Manufacture system for semiconductor device with thin gate insulating film Kiyoshi Irino, Ken-ichi Hikazutani, Tatsuya Kawamura, Taro Sugizaki, Satoshi Ohkubo +1 more 2006-01-10
6780699 Semiconductor device and method for fabricating the same Yasuyuki Tamura, Yusuke Morisaki, Yoshihiro Sugita, Kiyoshi Irino, Takayuki Aoyama +3 more 2004-08-24
6468926 Manufacture method and system for semiconductor device with thin gate insulating film of oxynitride Kiyoshi Irino, Ken-ichi Hikazutani, Tatsuya Kawamura, Taro Sugizaki, Satoshi Ohkubo +1 more 2002-10-22
5424243 Method of making a compound semiconductor crystal-on-substrate structure 1995-06-13
5312783 Process for the preparation of a high dielectric thin film using ECR plasma CVD Satoshi Nakai 1994-05-17
5210052 Method for fabricating a semiconductor substrate 1993-05-11
5183778 Method of producing a semiconductor device 1993-02-02
5107317 Semiconductor device with first and second buffer layers 1992-04-21
5057880 Semiconductor device having a heteroepitaxial substrate Takashi Eshita, Toshikazu Inoue 1991-10-15
5019529 Heteroepitaxial growth method 1991-05-28
4929985 Compound semiconductor device 1990-05-29
4781945 Process for the formation of phosphosilicate glass coating Masahide Nishimura, Kenji Koyama, Atsuhiro Tsukune 1988-11-01
4741919 Process for preparation of semiconductor device 1988-05-03
4581622 UV erasable EPROM with UV transparent silicon oxynitride coating Mikio Takagi, Kenji Koyama 1986-04-08
4539068 Vapor phase growth method Mikio Takagi, Kenji Koyama 1985-09-03
4532022 Process of producing a semiconductor device Mikio Takagi, Kenji Koyama 1985-07-30
4406053 Process for manufacturing a semiconductor device having a non-porous passivation layer Yoshimi Shioya 1983-09-27
4394401 Method of plasma enhanced chemical vapor deposition of phosphosilicate glass film Yoshimi Shioya, Mamoru Maeda, Mikio Takagi 1983-07-19
4384933 Method of reactive sputtering 1983-05-24
4363868 Process of producing semiconductor devices by forming a silicon oxynitride layer by a plasma CVD technique which is employed in a selective oxidation process Mamoru Maeda 1982-12-14