Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8578777 | Method for quantitatively evaluating concentration of atomic vacancies existing in silicon wafer, method for manufacturing silicon wafer, and silicon wafer manufactured by the method for manufacturing silicon wafer | Terutaka Goto, Yuichi Nemoto, Mitsuhiro Akatsu | 2013-11-12 |
| 8215175 | Quantitative evaluation device of atomic vacancies existing in silicon wafer, method for the device, silicon wafer manufacturing method, and thin-film oscillator | Terutaka Goto, Yuichi Nemoto | 2012-07-10 |
| 8037761 | Quantitative evaluation device and method of atomic vacancy existing in silicon wafer | Terutaka Goto, Yuichi Nemoto, Masataka Hourai | 2011-10-18 |
| 8017260 | Secondary battery having third terminal other than positive and negative electrode terminals and battery comprising it | Chika Kanbe | 2011-09-13 |
| 7906443 | Controlling oxygen precipitates in silicon wafers using infrared irradiation and heating | Katsuto Tanahashi | 2011-03-15 |
| 7700227 | Module | — | 2010-04-20 |
| 7087344 | Battery module | — | 2006-08-08 |
| 7029789 | Flat-type cell and combined battery utilizing the same | — | 2006-04-18 |
| 6528382 | Semiconductor device and method for fabricating the same | Tsunenori Yamauchi, Katsuhiro Homma | 2003-03-04 |
| 5286658 | Process for producing semiconductor device | Yoshimi Shirakawa | 1994-02-15 |
| 5066599 | Silicon crystal oxygen evaluation method using fourier transform infrared spectroscopy (FTIR) and semiconductor device fabrication method using the same | Shuichi Muraishi | 1991-11-19 |
| 4803884 | Method for measuring lattice defects in semiconductor | Tsutomu Ogawa, Haruhisa Mori, Kunihiko Wada | 1989-02-14 |
| 4480682 | Apparatus for freezing fertilized ova, spermatozoa or the like | Nobuo Sakao, Yasuo Kuraoka | 1984-11-06 |