Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11783248 | United states construction management system and method | Chikashi Shike, Masahiro Kurihara | 2023-10-10 |
| 8578777 | Method for quantitatively evaluating concentration of atomic vacancies existing in silicon wafer, method for manufacturing silicon wafer, and silicon wafer manufactured by the method for manufacturing silicon wafer | Terutaka Goto, Hiroshi Kaneta, Mitsuhiro Akatsu | 2013-11-12 |
| 8215175 | Quantitative evaluation device of atomic vacancies existing in silicon wafer, method for the device, silicon wafer manufacturing method, and thin-film oscillator | Terutaka Goto, Hiroshi Kaneta | 2012-07-10 |
| 8037761 | Quantitative evaluation device and method of atomic vacancy existing in silicon wafer | Terutaka Goto, Hiroshi Kaneta, Masataka Hourai | 2011-10-18 |