Issued Patents All Time
Showing 26–34 of 34 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7865797 | Memory device with adjustable read reference based on ECC and method thereof | Ronald J. Syzdek | 2011-01-04 |
| 7782664 | Method for electrically trimming an NVM reference cell | Horacio P. Gasquet, Peter Kuhn, Ronald J. Syzdek | 2010-08-24 |
| 7649782 | Non-volatile memory having a dynamically adjustable soft program verify voltage level and method therefor | Jon S. Choy | 2010-01-19 |
| 7640389 | Non-volatile memory having a multiple block erase mode and method therefor | Jon S. Choy | 2009-12-29 |
| 7599236 | In-circuit Vt distribution bit counter for non-volatile memory devices | Larry J. Grieve, Thomas Jew | 2009-10-06 |
| 7545679 | Electrical erasable programmable memory transconductance testing | Chen He, Ronald J. Syzdek | 2009-06-09 |
| 6937047 | Integrated circuit with test pad structure and method of testing | Tu-Anh N. Tran, Peter R. Harper, Chu-Chung Lee, William Williams, III, Lois Yong | 2005-08-30 |
| 6826103 | Auto-tuneable reference circuit for flash EEPROM products | Nathan Moon, Sung-Wei Lin | 2004-11-30 |
| 6226200 | In-circuit memory array bit cell threshold voltage distribution measurement | David W. Chrudimsky, Thomas Jew | 2001-05-01 |