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Laser failure early warning indicator |
Mahan Movassaghi, Rohit Mittal, Jen-Chyun Chen |
2021-11-16 |
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Methods related to power semiconductor devices with thick bottom oxide layers |
Ashok Challa, Alan Elbanhawy, Dean E. Probst, Steven Sapp, Peter H. Wilson +7 more |
2015-01-20 |
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Power device with self-aligned source regions |
Becky Losee, Dean E. Probst |
2014-05-06 |
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Field effect transistor and schottky diode structures |
Christopher Boguslaw Kocon, Steven Sapp, Paul Thorup, Dean E. Probst, Becky Losee +3 more |
2014-03-25 |
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Methods of making power semiconductor devices with thick bottom oxide layer |
Ashok Challa, Alan Elbanhawy, Dean E. Probst, Steven Sapp, Peter H. Wilson +7 more |
2012-03-27 |
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Methods for testing lasers using optical burn-in |
Charles B. Roxlo, T. H. Ola Sjolund, Tsurugi Sudo |
2011-11-29 |
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Power device with trenches having wider upper portion than lower portion |
Becky Losee, Dean E. Probst |
2011-10-11 |
| 7799636 |
Power device with trenches having wider upper portion than lower portion |
Becky Losee, Dean E. Probst |
2010-09-21 |
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High-power optical burn-in |
Charles B. Roxlo, T. H. Ola Sjolund, Tsurugi Sudo |
2010-09-14 |
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Method for forming inter-poly dielectric in shielded gate field effect transistor |
Dean E. Probst, Fred Session |
2009-10-06 |
| 7595524 |
Power device with trenches having wider upper portion than lower portion |
Becky Losee, Dean E. Probst |
2009-09-29 |
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Shielded gate field effect transistor with improved inter-poly dielectric |
Dean E. Probst, Fred Session |
2008-06-10 |
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Method for forming a trench MOSFET having self-aligned features |
Becky Losee, Dean E. Probst |
2008-03-18 |
| 7078296 |
Self-aligned trench MOSFETs and methods for making the same |
Duc Chau, Becky Losee, Bruce D. Marchant, Dean E. Probst, James J. Murphy |
2006-07-18 |
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Detecting pinholes in vertical cavity surface-emitting laser passivation |
Gregory DeBrabander, Suning Xie, Matthew Slater |
2006-03-14 |
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Structure and method for forming a trench MOSFET having self-aligned features |
Becky Losee, Dean E. Probst |
2005-07-12 |
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Mask design |
— |
1997-02-11 |
| 5460034 |
Method for measuring and analyzing surface roughness on semiconductor laser etched facets |
— |
1995-10-24 |
| 5259925 |
Method of cleaning a plurality of semiconductor devices |
Joseph L. Levy, Danny J. Krebs |
1993-11-09 |