PS

Paul J. Schuele

EL Elux: 46 patents #1 of 17Top 6%
SA Sharp Laboratories Of America: 30 patents #36 of 419Top 9%
Micron: 29 patents #636 of 6,345Top 15%
Sharp Kabushiki Kaisha: 3 patents #4,164 of 10,731Top 40%
NA Nanosys: 2 patents #80 of 152Top 55%
PS Productive Application Solutions: 1 patents #5 of 6Top 85%
IN Innolux: 1 patents #643 of 1,038Top 65%
AT Advanced Optoelectronic Technology: 1 patents #84 of 118Top 75%
RI Ramtron International: 1 patents #54 of 82Top 70%
📍 Washougal, WA: #1 of 115 inventorsTop 1%
🗺 Washington: #199 of 76,902 inventorsTop 1%
Overall (All Time): #11,011 of 4,157,543Top 1%
114
Patents All Time

Issued Patents All Time

Showing 101–114 of 114 patents

Patent #TitleCo-InventorsDate
5856704 Capacitor, integrated circuitry, diffusion barriers, and method for forming an electrically conductive diffusion barrier 1999-01-05
5843830 Capacitor, and methods for forming a capacitor Thomas M. Graettinger, Brent A. McClure 1998-12-01
5844771 Capacitor construction Thomas M. Graettinger, Brent A. McClure 1998-12-01
5808854 Capacitor construction with oxidation barrier blocks Thomas A. Figura 1998-09-15
5793076 Scalable high dielectric constant capacitor Pierre C. Fazan 1998-08-11
5760474 Capacitor, integrated circuitry, diffusion barriers, and method for forming an electrically conductive diffusion barrier 1998-06-02
5719418 Contact-substrate for a semiconductor device comprising a contour Nanseng Jeng, Steven T. Harshfield 1998-02-17
5717250 Sputter and CVD deposited titanium nitride barrier layer between a platinum layer and a polysilicon plug Pierre C. Fazan 1998-02-10
5654222 Method for forming a capacitor with electrically interconnected construction Gurtej S. Sandhu, Wayne Kinney 1997-08-05
5654224 Capacitor construction with oxidation barrier blocks Thomas A. Figura 1997-08-05
5559666 Capacitor construction with oxidation barrier blocks Thomas A. Figura 1996-09-24
5492853 Method of forming a contact using a trench and an insulation layer during the formation of a semiconductor device Nanseng Jeng, Steven T. Harshfield 1996-02-20
5464786 Method for forming a capacitor having recessed lateral reaction barrier layer edges Thomas A. Figura 1995-11-07
5216572 Structure and method for increasing the dielectric constant of integrated ferroelectric capacitors William Larson 1993-06-01