Issued Patents All Time
Showing 126–128 of 128 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7227628 | Wafer inspection systems and methods for analyzing inspection data | Paul Sullivan, George Kren, Eliezer Rosengaus, Patrick Huet, Martin Plihal +1 more | 2007-06-05 |
| 7006886 | Detection of spatially repeating signatures | Patrick Huet, Martin Plihal | 2006-02-28 |
| 6718526 | Spatial signature analysis | Peter Eldredge, Patrick Huet, Sandeep Bhagwat, Kai-Chih Chi, Kai Liu +3 more | 2004-04-06 |