Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
IB

Ingo Bork — 12 Patents

D2D2S: 12 patents #7 of 39Top 20%
Mountain View, CA: #1,843 of 11,022 inventorsTop 20%
California: #51,404 of 386,348 inventorsTop 15%
Overall (All Time): #396,045 of 4,157,543Top 10%
12 Patents All Time
Ingo Bork has been granted 12 US patents while listed as an inventor at D2S. The first was granted in 2013 and the most recent in July 2018. Ingo Bork ranks #396,045 of 4,157,543 US inventors in our database (top 9.5%). Patent records list Ingo Bork in Mountain View, CA, US.

Patents per Year

Patents granted per year, 2013 to 2018Bar chart with a peak of 5 patents in 2015.peak 52013: 1 patents20132014: 2 patents20142015: 5 patents20152016: 2 patents20162017: 1 patents20172018: 1 patents2018

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
10031413 Method and system for forming patterns using charged particle beam lithography Akira Fujimura, Anatoly Aadamov, Eldar Khaliullin 2018-07-24
9612530 Method and system for design of enhanced edge slope patterns for charged particle beam lithography Akira Fujimura, Kazuyuki Hagiwara, Stephen F. Meier 2017-04-04
9465297 Method and system for forming patterns with charged particle beam lithography Akira Fujimura 2016-10-11
9400857 Method and system for forming patterns using charged particle beam lithography Akira Fujimura, Anatoly Aadamov, Eldar Khaliullin 2016-07-26
9164372 Method and system for forming non-manhattan patterns using variable shaped beam lithography Akira Fujimura, Etienne Jacques 2015-10-20
9091946 Method and system for forming non-manhattan patterns using variable shaped beam lithography Akira Fujimura, Etienne Jacques 2015-07-28
9057956 Method and system for design of enhanced edge slope patterns for charged particle beam lithography Akira Fujimura, Kazuyuki Hagiwara, Stephen F. Meier 2015-06-16
9043734 Method and system for forming high accuracy patterns using charged particle beam lithography Akira Fujimura, Kazuyuki Hagiwara, Stephen F. Meier 2015-05-26
9034542 Method and system for forming patterns with charged particle beam lithography Akira Fujimura 2015-05-19
8719739 Method and system for forming patterns using charged particle beam lithography Akira Fujimura, Anatoly Aadamov, Eldar Khaliullin 2014-05-06
8703389 Method and system for forming patterns with charged particle beam lithography Akira Fujimura 2014-04-22
8473875 Method and system for forming high accuracy patterns using charged particle beam lithography Akira Fujimura, Kazuyuki Hagiwara, Stephen F. Meier 2013-06-25