IB

Ingo Bork

D2 D2S: 12 patents #7 of 39Top 20%
Overall (All Time): #417,004 of 4,157,543Top 15%
12
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10031413 Method and system for forming patterns using charged particle beam lithography Akira Fujimura, Anatoly Aadamov, Eldar Khaliullin 2018-07-24
9612530 Method and system for design of enhanced edge slope patterns for charged particle beam lithography Akira Fujimura, Kazuyuki Hagiwara, Stephen F. Meier 2017-04-04
9465297 Method and system for forming patterns with charged particle beam lithography Akira Fujimura 2016-10-11
9400857 Method and system for forming patterns using charged particle beam lithography Akira Fujimura, Anatoly Aadamov, Eldar Khaliullin 2016-07-26
9164372 Method and system for forming non-manhattan patterns using variable shaped beam lithography Akira Fujimura, Etienne Jacques 2015-10-20
9091946 Method and system for forming non-manhattan patterns using variable shaped beam lithography Akira Fujimura, Etienne Jacques 2015-07-28
9057956 Method and system for design of enhanced edge slope patterns for charged particle beam lithography Akira Fujimura, Kazuyuki Hagiwara, Stephen F. Meier 2015-06-16
9043734 Method and system for forming high accuracy patterns using charged particle beam lithography Akira Fujimura, Kazuyuki Hagiwara, Stephen F. Meier 2015-05-26
9034542 Method and system for forming patterns with charged particle beam lithography Akira Fujimura 2015-05-19
8719739 Method and system for forming patterns using charged particle beam lithography Akira Fujimura, Anatoly Aadamov, Eldar Khaliullin 2014-05-06
8703389 Method and system for forming patterns with charged particle beam lithography Akira Fujimura 2014-04-22
8473875 Method and system for forming high accuracy patterns using charged particle beam lithography Akira Fujimura, Kazuyuki Hagiwara, Stephen F. Meier 2013-06-25