Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
SM

Stephen F. Meier — 15 Patents

SYSynopsys: 5 patents #244 of 2,302Top 15%
D2D2S: 4 patents #16 of 39Top 45%
CSCandescent Intellectual Property Services: 1 patents #48 of 83Top 60%
CTCandescent Technologies: 1 patents #80 of 125Top 65%
PMPhase Metrics: 1 patents #18 of 49Top 40%
Sunnyvale, CA: #1,840 of 14,302 inventorsTop 15%
California: #40,789 of 386,348 inventorsTop 15%
Overall (All Time): #307,048 of 4,157,543Top 8%
15 Patents All Time
Stephen F. Meier has been granted 15 US patents while listed as an inventor at Synopsys. The first was granted in 1997 and the most recent in April 2017. Stephen F. Meier ranks #307,048 of 4,157,543 US inventors in our database (top 7.4%). Patent records list Stephen F. Meier in Sunnyvale, CA, US.

Patents per Year

Patents granted per year, 1997 to 2017Bar chart with a peak of 3 patents in 1997.peak 31997: 3 patents19971999: 1 patents19992000: 1 patents20002002: 1 patents20022004: 1 patents20042009: 2 patents20092011: 1 patents20112013: 2 patents20132015: 2 patents20152017: 1 patents2017

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
9612530 Method and system for design of enhanced edge slope patterns for charged particle beam lithography Akira Fujimura, Kazuyuki Hagiwara, Ingo Bork 2017-04-04
9057956 Method and system for design of enhanced edge slope patterns for charged particle beam lithography Akira Fujimura, Kazuyuki Hagiwara, Ingo Bork 2015-06-16
9043734 Method and system for forming high accuracy patterns using charged particle beam lithography Akira Fujimura, Kazuyuki Hagiwara, Ingo Bork 2015-05-26
8473875 Method and system for forming high accuracy patterns using charged particle beam lithography Akira Fujimura, Kazuyuki Hagiwara, Ingo Bork 2013-06-25
8369038 Method and system for distinguishing spatial and thermal defects on perpendicular media David H. Ferry, Hassan Jalalian 2013-02-05
7929235 Method and system for distinguishing spatial and thermal defects on perpendicular media David H. Ferry, Hassan Jalalian 2011-04-19
7630154 Hard disk inspection method and system David H. Ferry 2009-12-08
7532422 Method and system for distinguishing spatial and thermal defects on perpendicular media David H. Ferry, Hassan Jalalian 2009-05-12
6714017 Method and system for infrared detection of electrical short defects Marius Enachescu, Sergey Belikov 2004-03-30
6345379 Method and apparatus for estimating internal power consumption of an electronic circuit represented as netlist Adel Khouja, Shankar Krishnamoorthy, Frederic G. Mailhot 2002-02-05 $31,663,000
6075932 Method and apparatus for estimating internal power consumption of an electronic circuit represented as netlist Adel Khouja, Shankar Krishnamoorthy, Frederic G. Mailhot 2000-06-13 $39,568,000
5872664 Distortion of an isolated pulse 1999-02-16
5696694 Method and apparatus for estimating internal power consumption of an electronic circuit represented as netlist Adel Khouja, Shankar Krishnamoorthy, Frederic G. Mailhot 1997-12-09 $16,759,000
5682320 Method for electronic memory management during estimation of average power consumption of an electronic circuit Adel Khouja, Shankar Krishnamoorthy, Frederic G. Mailhot 1997-10-28 $14,469,000
5668732 Method for estimating power consumption of a cyclic sequential electronic circuit Adel Khouja, Shankar Krishnamoorthy, Frederic G. Mailhot 1997-09-16 $28,705,000