Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8369038 | Method and system for distinguishing spatial and thermal defects on perpendicular media | Stephen F. Meier, Hassan Jalalian | 2013-02-05 |
| 7929235 | Method and system for distinguishing spatial and thermal defects on perpendicular media | Stephen F. Meier, Hassan Jalalian | 2011-04-19 |
| 7630154 | Hard disk inspection method and system | Stephen F. Meier | 2009-12-08 |
| 7532422 | Method and system for distinguishing spatial and thermal defects on perpendicular media | Stephen F. Meier, Hassan Jalalian | 2009-05-12 |
| 5792947 | Method and apparatus for combined glide and defect analysis | Vladimir Pogrebinsky, Igor Iosilevsky, George A. Burt, Jr. | 1998-08-11 |