Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5883714 | Method and apparatus for detecting defects on a disk using interferometric analysis on reflected light | Peter C. Jann, Joel Libove | 1999-03-16 |
| 5875029 | Apparatus and method for surface inspection by specular interferometric and diffuse light detection | Peter C. Jann, Wayne Li, Igor Iosilevsky, Kenneth H. Womack, Vlastimil Cejna | 1999-02-23 |
| 5792947 | Method and apparatus for combined glide and defect analysis | Vladimir Pogrebinsky, Igor Iosilevsky, David H. Ferry | 1998-08-11 |
| 4702101 | Apparatus and method for testing the calibration of a hard disk substrate tester | David C. Abbe | 1987-10-27 |