PJ

Peter C. Jann

PM Phase Metrics: 3 patents #7 of 49Top 15%
CT Caliper Technologies: 2 patents #27 of 50Top 55%
ST Seagate Technology: 2 patents #1,946 of 4,626Top 45%
TI Tencor Instruments: 2 patents #17 of 50Top 35%
CS Caliper Life Sciences: 1 patents #93 of 143Top 70%
HT Hmt Technology: 1 patents #15 of 34Top 45%
Overall (All Time): #468,992 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7623427 Surface inspection by amplitude modulated specular light detection Wafaa Abdalla 2009-11-24
7554670 Surface inspection by double pass laser doppler vibrometry Wafaa Abdalla 2009-06-30
6881312 Ultra high throughput microfluidic analytical systems and methods Anne R. Kopf-Sill, Andrea W. Chow, Morten Jensen, Michael A. Spaid, Colin B. Kennedy +1 more 2005-04-19
6547941 Ultra high throughput microfluidic analytical systems and methods Anne R. Kopf-Sill, Andrea W. Chow, Morten Jensen, Michael A. Spaid, Colin B. Kennedy +1 more 2003-04-15
6358387 Ultra high throughput microfluidic analytical systems and methods Anne R. Kopf-Sill, Andrea W. Chow, Morten Jensen, Michael A. Spaid, Colin B. Kennedy +1 more 2002-03-19
5978091 Laser-bump sensor method and apparatus Marco A. Krumbuegel, Reginald Lee, Ming M. Yang 1999-11-02
5883714 Method and apparatus for detecting defects on a disk using interferometric analysis on reflected light George A. Burt, Jr., Joel Libove 1999-03-16
5875029 Apparatus and method for surface inspection by specular interferometric and diffuse light detection Wayne Li, Igor Iosilevsky, Kenneth H. Womack, Vlastimil Cejna, George A. Burt, Jr. 1999-02-23
5719840 Optical sensor with an elliptical illumination spot 1998-02-17
5189481 Particle detector for rough surfaces Kenneth P. Gross, Armand P. Neukermans 1993-02-23
5076692 Particle detection on a patterned or bare wafer surface Armand P. Neukermans, Ralph C. Wolf, David A. Wolze, Stanley Stokowski 1991-12-31