KW

Kenneth H. Womack

PM Phase Metrics: 9 patents #2 of 49Top 5%
Eastman Kodak: 2 patents #3,607 of 8,114Top 45%
VI Veeco Instruments: 1 patents #165 of 323Top 55%
Overall (All Time): #388,838 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6677565 High speed autofocus and tilt for an optical imaging system Michael H. Wahl, Phillip Roberts 2004-01-13
6314212 High precision optical metrology using frequency domain interpolation Daniel Lee Abraham 2001-11-06
6184993 Apparatus for measuring a small gap using a Savart plate Carlos Alberto Duran 2001-02-06
5875029 Apparatus and method for surface inspection by specular interferometric and diffuse light detection Peter C. Jann, Wayne Li, Igor Iosilevsky, Vlastimil Cejna, George A. Burt, Jr. 1999-02-23
5818592 Non-contact optical glide tester L. Allan Butler, Michael H. Wahl 1998-10-06
5808736 Thin film flying height calibration disk for calibrating flying height testers Carlos Alberto Duran, Christopher A. Lacey 1998-09-15
5793480 Combined interferometer/ellipsometer for measuring small spacings Christopher A. Lacey, Carlos Alberto Duran, Ed Ross, Semyon Nodelman 1998-08-11
5781299 Determining the complex refractive index phase offset in interferometric flying height testing L. Allan Butler 1998-07-14
5777740 Combined interferometer/polarimeter Christopher A. Lacey 1998-07-07
5696585 Apparatus and method for efficient electrostatic discharge on glass disks in flying height testers Michael H. Wahl 1997-12-09
5638178 Imaging polarimeter detector for measurement of small spacings Christopher A. Lacey 1997-06-10
5085502 Method and apparatus for digital morie profilometry calibrated for accurate conversion of phase information into distance measurements in a plurality of directions Brian J. Kwarta, David H. Outterson, James R. Reda 1992-02-04
4963984 Optical projection camera alignment system and method 1990-10-16