Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7482576 | Apparatuses for and methods of monitoring optical radiation parameters for substrate processing operations | Randall S. Mundt, Andrew Beers, Paul MacDonald, Mason L. Freed | 2009-01-27 |
| 7299148 | Methods and apparatus for low distortion parameter measurements | Costas J. Spanos, Michael Welch, Kameshwar Poolla, Mason L. Freed | 2007-11-20 |
| 7064568 | Optical testing of integrated circuits with temperature control | Don Haga | 2006-06-20 |
| 6836014 | Optical testing of integrated circuits with temperature control | Don Haga | 2004-12-28 |