Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12045969 | Automated root cause analysis for defect detection during fabrication processes of semiconductor structures | Jens Timo Neumann, Eugen Foca, Ramani Pichumani, Abhilash Srikantha, Christian Wojek +1 more | 2024-07-23 |
| 11728130 | Method of recording an image using a particle microscope | Dirk Zeidler, Thomas Korb, Philipp Huethwohl, Jens Timo Neumann, Christof Riedesel +2 more | 2023-08-15 |