Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12175650 | Processing image data sets | Jens Timo Neumann, Christian Wojek, Thomas Korb | 2024-12-24 |
| 12045969 | Automated root cause analysis for defect detection during fabrication processes of semiconductor structures | Jens Timo Neumann, Eugen Foca, Ramani Pichumani, Christian Wojek, Thomas Korb +1 more | 2024-07-23 |
| 11436506 | Method and devices for determining metrology sites | Christian Wojek, Keumsil Lee, Thomas Korb, Jens Timo Neumann, Eugen Foca | 2022-09-06 |