Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11728130 | Method of recording an image using a particle microscope | Dirk Zeidler, Thomas Korb, Jens Timo Neumann, Christof Riedesel, Christian Wojek +2 more | 2023-08-15 |
| 10901391 | Multi-scanning electron microscopy for wafer alignment | Jagdish Chandra Saraswatula, Jens Timo Neumann, Thomas Korb, Raghavendra Hanumantha Nayak | 2021-01-26 |