Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12288706 | Parameterizing x-ray scattering measurement using slice-and-image tomographic imaging of semiconductor structures | Hans-Michael Stiepan, Thomas Korb, Eugen Foca, Alex Buxbaum, Jens Timo Neumann | 2025-04-29 |
| 12288705 | FIB-SEM 3D tomography for measuring shape deviations of HAR structures | Amir Avishai, Alex Buxbaum, Eugen Foca, Thomas Korb, Keumsil Lee | 2025-04-29 |
| 12283504 | Contact area size determination between 3D structures in an integrated semiconductor sample | Alex Buxbaum, Amir Avishai, Thomas Korb, Eugen Foca, Keumsil Lee | 2025-04-22 |
| 12148139 | Methods and evaluation devices for analyzing three-dimensional data sets representing devices | Ramani Pichumani, Thomas Korb, Jens Timo Neumann | 2024-11-19 |
| 12056865 | Wafer-tilt determination for slice-and-image process | Chuong Huynh, Thomas Korb | 2024-08-06 |
| 11915908 | Method for measuring a sample and microscope implementing the method | Eugen Foca, Amir Avishai, Thomas Korb, Jens Timo Neumann, Keumsil Lee | 2024-02-27 |
| 11848172 | Method for measuring a sample and microscope implementing the method | Chuong Huynh, Thomas Korb, Alex Buxbaum, Amir Avishai | 2023-12-19 |