Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12393008 | Method and device for capturing microscopy objects in image data | Manuel Amthor, Daniel Haase, Christian Kungel | 2025-08-19 |
| 12322096 | Multi-task learning of white light photographs for a surgical microscope | Stefan Saur, Marco Wilzbach, Anna Alperovich | 2025-06-03 |
| 12307334 | Method and device for evaluating a statistically distributed measured value in the examination of an element of a photolithography process | Dirk Seidel, Christian Wojek, Susanne Töpfer, Carsten Schmidt, Christoph Husemann | 2025-05-20 |
| 12190567 | Digital contrast post-processing of microscopy images | Rebecca Elsaesser, Wibke Hellmich, Volker Doering | 2025-01-07 |
| 12135540 | Devices and methods for examining and/or processing an element for photolithography | Michael Budach, Nicole Auth, Christian Rensing, Christian Wojek | 2024-11-05 |
| 12111579 | Method and apparatus for evaluating an unknown effect of defects of an element of a photolithography process | Christoph Husemann, Dirk Seidel, Carsten Schmidt | 2024-10-08 |
| 12087041 | Microscopy system and method for generating a virtually stained image | Matthias Eibl, Christian Kungel, Anselm Brachmann, Daniel Haase, Manuel Amthor | 2024-09-10 |
| 12001145 | Apparatus and method for analyzing an element of a photolithography process with the aid of a transformation model | Christoph Husemann, Dirk Seidel, Carsten Schmidt, Thomas Scheruebl | 2024-06-04 |
| 11790510 | Material testing of optical test pieces | Lars Stoppe, Niklas Mevenkamp | 2023-10-17 |
| 11774859 | Method and apparatus for evaluating an unknown effect of defects of an element of a photolithography process | Christoph Husemann, Dirk Seidel, Carsten Schmidt | 2023-10-03 |
| 11508045 | Microscopy system and method for generating stylized contrast images | Manuel Amthor, Daniel Haase, Christian Kungel | 2022-11-22 |