YW

Yumi Watanabe

Canon: 14 patents #4,747 of 19,416Top 25%
KT Kabushiki Kaisha Toshiba: 5 patents #5,683 of 21,451Top 30%
Ricoh Company: 1 patents #6,936 of 9,818Top 75%
Overall (All Time): #220,037 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #TitleCo-InventorsDate
11822211 Imaging optical system storing information on its aberration, imaging apparatus, and control method thereof Hideyuki Hamano 2023-11-21
11099459 Focus adjustment device and method capable of executing automatic focus detection, and imaging optical system storing information on aberrations thereof Hideyuki Hamano 2021-08-24
10212334 Focusing adjustment apparatus and focusing adjustment method Hideyuki Hamano 2019-02-19
10025162 Focus adjustment device for correcting autofocus of focus lens using captured image signal to be recorded, method for controlling the same, and image capture apparatus Hideyuki Hamano 2018-07-17
9998652 Focusing adjustment apparatus and focusing adjustment method Hideyuki Hamano 2018-06-12
9843710 Focusing adjustment apparatus and focusing adjustment method Hideyuki Hamano 2017-12-12
9742984 Image capturing apparatus and method of controlling the same Akihiko Kanda, Shun Nakamura 2017-08-22
9641741 Focus detection apparatus and method for controlling the same 2017-05-02
9313469 Image capturing apparatus and method of controlling the same Akihiko Kanda, Shun Nakamura 2016-04-12
8363251 Image forming apparatus, print data generation method and computer program for forming an image with halftone processing that uses constraint data Tomokazu Yanai 2013-01-29
8253974 Image forming apparatus, image processing apparatus, and control method therefor 2012-08-28
8144943 Apparatus and method for detecting specific subject in image Satoshi Yashiro, Kotaro Yano 2012-03-27
8130415 Image processing apparatus, image forming apparatus, and control method thereof, which form an image by applying N-ary processing Tomokazu Yanai, Atsushi Ushiroda, Hisashi Ishikawa 2012-03-06
8014587 Pattern test method of testing, in only specific region, defect of pattern on sample formed by charged beam lithography apparatus 2011-09-06
7986440 Image processing apparatus, image forming apparatus, and control method thereof, which form an image by applying N-ary processing Tomokazu Yanai, Atsushi Ushiroda, Hisashi Ishikawa 2011-07-26
7359867 Computer system, server, and method for supporting cooking, and computer program generator Kenji Kuwana, Yukiko Inada, Takahisa Hanajima, Makoto Nakanishi, Fumikazu Wakaki 2008-04-15
6140654 Charged beam lithography apparatus and method thereof Tetsuro Nakasugi 2000-10-31
6093931 Pattern-forming method and lithographic system Kazuyoshi Sugihara, Hiromi Niiyama, Shunko Magoshi, Atsushi Ando, Tetsuro Nakasugi +4 more 2000-07-25
5994030 Pattern-forming method and lithographic system Kazuyoshi Sugihara, Hiromi Niiyama, Shunko Magoshi, Atsushi Ando, Tetsuro Nakasugi +4 more 1999-11-30
5933211 Charged beam lithography apparatus and method thereof Tetsuro Nakasugi 1999-08-03