KT

Kouichirou Tsujita

Canon: 17 patents #3,927 of 19,416Top 25%
Mitsubishi Electric: 10 patents #2,886 of 25,717Top 15%
RT Renesas Technology: 4 patents #758 of 3,337Top 25%
Overall (All Time): #119,061 of 4,157,543Top 3%
31
Patents All Time

Issued Patents All Time

Showing 1–25 of 31 patents

Patent #TitleCo-InventorsDate
9690201 Drawing method and method of manufacturing article Masato Muraki 2017-06-27
9551926 Determination method, storage medium and information processing apparatus Yuichi Gyoda, Koji Mikami 2017-01-24
9448495 Resist pattern calculation method and calculation program storage medium Ryo Nakayama, Koji Mikami, Hiroyuki Ishii 2016-09-20
9406510 Pattern forming method and article manufacturing method Yuichi Gyoda 2016-08-02
9268239 Exposure method and storage medium Yuichi Gyoda 2016-02-23
9036897 Storage medium storing computer program for determining at least one of exposure condition and mask pattern Hiroyuki Ishii, Yuichi Gyoda, Koji Mikami 2015-05-19
8949748 Recording medium recording program for generating mask data, method for manufacturing mask, and exposure method Hiroyuki Ishii 2015-02-03
8867023 Method for determining exposure condition and computer-readable storage media storing program for determining exposure condition 2014-10-21
8739079 Recording medium and determination method Axelrad Valery 2014-05-27
8582083 Effective light source shape database generation method, optical image calculation method, recording medium, exposure method, and device fabrication method Hiroto Yoshii, Koji Mikami 2013-11-12
8584055 Non-transitory computer-readable storage medium, decision method and computer for deciding exposure condition using evaluation item of interest and auxiliary evaluation item Yuichi Gyoda 2013-11-12
8339579 Exposure method 2012-12-25
8334968 Recording medium storing program for determining exposure parameter, exposure method, and method of manufacturing device Koji Mikami 2012-12-18
8085386 Method for determining exposure condition and computer-readable storage media storing program for determining exposure condition 2011-12-27
8049191 Method of transferring pattern of reticle, computer readable storage medium, and method of manufacturing device Koji Mikami, Hiroyuki Ishii 2011-11-01
8029954 Exposure method and memory medium storing computer program Koji Mikami, Hiroyuki Ishii 2011-10-04
7642022 Parameter determination method, exposure method, device fabrication method, and storage medium Hiroto Yoshii, Koji Mikami 2010-01-05
6938238 Method of manufacturing electronic device Takashi Okagawa, Tetsuya Yamada, Atsushi Ueno, Atsumi Yamaguchi 2005-08-30
6916749 Method of manufacturing semiconductor device Akihiro Nakae 2005-07-12
6849486 Method of manufacturing a thinned gate electrode utilizing protective films and etching Tetsuya Yamada, Atsushi Ueno, Atsumi Yamaguchi, Takashi Okagawa 2005-02-01
6774043 Method of manufacturing semiconductor device Atsumi Yamaguchi 2004-08-10
6607992 Antireflection coating and semiconductor device manufacturing method Atsumi Yamaguchi, Junjiro Sakai, Kouji Oda, Koichiro Narimatsu 2003-08-19
6518196 Method of manufacturing semiconductor device Tetsuya Yamada, Atsumi Yamaguchi 2003-02-11
6461800 Resist patterning method 2002-10-08
5955227 Pattern determination method Junjiro Sakai, Akihiro Nakae 1999-09-21