HT

Huan-Chih Tsai

CS Cadence Design Systems: 5 patents #303 of 2,263Top 15%
VI Visualon: 3 patents #2 of 21Top 10%
AS Agere Systems: 2 patents #639 of 1,849Top 35%
AG Agere Systems Guardian: 1 patents #274 of 810Top 35%
📍 Saratoga, CA: #788 of 2,933 inventorsTop 30%
🗺 California: #55,401 of 386,348 inventorsTop 15%
Overall (All Time): #450,025 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
11259069 Synchronized video player Cheng-Ta Hsieh, Hyoheon Hong, Ming-Mao Chiang, Yubao LI 2022-02-22
11172246 Bitrate adaptation for low latency streaming Mei Fang, Yisheng Yao, Xuejun Dong 2021-11-09
9621613 Bitrate adaptation transitioning using key frames Cheng-Chi Huang, Chin-Yee Lin, Yang Cai 2017-04-11
RE44479 Method and mechanism for implementing electronic designs having power information specifications background Qi Wang, Ankur Gupta, Pinhong Chen, Christina Chu, Manish Pandey +6 more 2013-09-03
8516422 Method and mechanism for implementing electronic designs having power information specifications background Qi Wang, Ankur Gupta, Pinhong Chen, Christina Chu, Manish Pandey +5 more 2013-08-20
7739629 Method and mechanism for implementing electronic designs having power information specifications background Qi Wang, Ankur Gupta, Pinhong Chen, Christina Chu, Manish Pandey +5 more 2010-06-15
7694251 Method and system for verifying power specifications of a low power design Bharat Chandramouli, Manish Pandey, Chih-Chang Lin, Madan M. Das 2010-04-06
7669165 Method and system for equivalence checking of a low power design Manish Pandey, Rajat Arora, Chih-Chang Lin, Bharat Chandramouli, Kei-Yong Khoo 2010-02-23
6694466 Method and system for improving the test quality for scan-based BIST using a general test application scheme Kwang-Ting Cheng, Sudipta Bhawmik 2004-02-17
6463561 Almost full-scan BIST method and system having higher fault coverage and shorter test application time Sudipta Bhawmik, Kwang-Ting Cheng 2002-10-08
6256759 Hybrid algorithm for test point selection for scan-based BIST Sudipta Bhawmik, Kwang-Ting Cheng, Chih-Jen Lin 2001-07-03