SL

Shoutian Li

CM Cabot Microelectronics: 12 patents #16 of 207Top 8%
AC Anji Microelectronics (Shanghai) Co.: 2 patents #1 of 17Top 6%
CM Cmc Materials: 1 patents #33 of 67Top 50%
ET Ethyl: 1 patents #298 of 494Top 65%
Overall (All Time): #263,710 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12404423 Chemical-mechanical polishing liquid Xiaoming Ren, Changzheng Jia 2025-09-02
12365814 Chemical mechanical polishing solution Xiaoming Ren, Changzheng Jia 2025-07-22
12264266 Chemical mechanical polishing liquid Xiaoming Ren, Changzheng Jia 2025-04-01
11034862 Polishing composition and method utilizing abrasive particles treated with an aminosilane Steven Grumbine, William Ward, Pankaj Kumar Singh, Jeffrey Dysard 2021-06-15
10508219 Polishing composition and method utilizing abrasive particles treated with an aminosilane Steven Grumbine, William Ward, Pankaj Kumar Singh, Jeffrey Dysard 2019-12-17
9951054 CMP porous pad with particles in a polymeric matrix Robert Vacassy, Jaishankar Kasthuri 2018-04-24
9617450 Polishing composition and method utilizing abrasive particles treated with an aminosilane Steven Grumbine, William Ward, Pankaj Kumar Singh, Jeffrey Dysard 2017-04-11
9028572 Polishing composition and method utilizing abrasive particles treated with an aminosilane Steven Grumbine, William Ward, Pankaj Kumar Singh, Jeffrey Dysard 2015-05-12
8637404 Metal cations for initiating polishing Phillip W. Carter 2014-01-28
8591763 Halide anions for metal removal rate control 2013-11-26
8551202 Iodate-containing chemical-mechanical polishing compositions and methods Phillip W. Carter, Jian Zhang 2013-10-08
8529680 Compositions for CMP of semiconductor materials Francesco De Rege Thesauro, Steven Grumbine, Phillip W. Carter, Jian Zhang, David Schroeder +1 more 2013-09-10
8252687 Barrier slurry for low-k dielectrics Steven Grumbine, Jeffrey Dysard, Pankaj Kumar Singh 2012-08-28
7998228 Tantalum CMP compositions and methods 2011-08-16
7820067 Halide anions for metal removal rate control 2010-10-26
7803203 Compositions and methods for CMP of semiconductor materials Francesco De Rege Thesauro, Steven Grumbine, Phillip W. Carter, Jian Zhang, David Schroeder +1 more 2010-09-28
6255261 (Meth) acrylate copolymer pour point depressants Gregory P. Liesen, Tze-Chi Jao 2001-07-03