TH

Tuan Hoang

Broadcom: 10 patents #1,077 of 9,346Top 15%
AD Analog Devices: 2 patents #738 of 1,943Top 40%
HA Hughes Aircraft: 1 patents #1,260 of 2,963Top 45%
HL Hughes Electronics Limited: 1 patents #605 of 1,474Top 45%
TB The Boeing: 1 patents #8,242 of 15,756Top 55%
Overall (All Time): #324,447 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8886840 System and method for implementing a single chip having a multiple sub-layer PHY Ichiro Fujimori, Ben Tan, Lorenzo Longo 2014-11-11
8473640 System and method for implementing a single chip having a multiple sub-layer PHY Ichiro Fujimori, Ben Tan, Lorenzo Longo 2013-06-25
8230114 System and method for implementing a single chip having a multiple sub-layer PHY Ichiro Fujimori, Ben Tan, Lorenzo Longo 2012-07-24
7840134 Bit error rate based system and method for optimizing communication system performance Nong Fan, Hongtao Jiang, Keh-Chee Jen 2010-11-23
7548692 Bit error rate based system and method for optimizing communication system performance Nong Fan, Hongtao Jiang, Keh-Chee Jen 2009-06-16
7472318 System and method for determining on-chip bit error rate (BER) in a communication system Nong Fan, Hongtao Jiang 2008-12-30
7460490 Auto configuration for asynchronous transfer mode based access device Massoud Hadjiahmad, Andre Straker-Payne 2008-12-02
7406085 Auto configuration for asynchronous transfer mode based access device Massoud Hadjiahmad, Andre Straker-Payne 2008-07-29
7151894 Bit error rate based system and method for optimizing communication system performance Nong Fan, Hongtao Jiang, Keh-Chee Jen 2006-12-19
7127648 System and method for performing on-chip self-testing Hongtao Jiang 2006-10-24
7111208 On-chip standalone self-test system and method Hongtao Jiang 2006-09-19
7093172 System and method for determining on-chip bit error rate (BER) in a communication system Nong Fan, Hongtao Jiang 2006-08-15
6357026 System and method for at-speed interconnect tests Samuel Chu 2002-03-12
5606565 Method of applying boundary test patterns Christopher L. Edler, William D. Farwell, Ian Herman, Brian F. Keish, Alida G. Mascitelli 1997-02-25
5528610 Boundary test cell with self masking capability Christopher L. Edler, William D. Farwell, Ian Herman, Brian F. Keish, Alida G. Mascitelli 1996-06-18