Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5606565 | Method of applying boundary test patterns | Christopher L. Edler, William D. Farwell, Tuan Hoang, Brian F. Keish, Alida G. Mascitelli | 1997-02-25 |
| 5528610 | Boundary test cell with self masking capability | Christopher L. Edler, William D. Farwell, Tuan Hoang, Brian F. Keish, Alida G. Mascitelli | 1996-06-18 |