Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5606565 | Method of applying boundary test patterns | Christopher L. Edler, William D. Farwell, Ian Herman, Tuan Hoang, Brian F. Keish | 1997-02-25 |
| 5528610 | Boundary test cell with self masking capability | Christopher L. Edler, William D. Farwell, Ian Herman, Tuan Hoang, Brian F. Keish | 1996-06-18 |
| 5396183 | Method for continuously measuring delay margins in digital systems | William D. Farwell | 1995-03-07 |
| 5291141 | Method for continuously measuring delay margins in digital systems | William D. Farwell | 1994-03-01 |