Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Liming Tsau — 22 Patents

Broadcom: 12 patents #890 of 9,346Top 10%
APAvago Technologies General Ip (Singapore) Pte.: 1 patents #883 of 2,004Top 45%
NFNewport Fab: 1 patents #56 of 98Top 60%
Irvine, CA: #450 of 6,241 inventorsTop 8%
California: #25,951 of 386,348 inventorsTop 7%
Overall (All Time): #189,202 of 4,157,543Top 5%
22 Patents All Time
Liming Tsau has been granted 22 US patents while listed as an inventor at Broadcom. The first was granted in 2002 and the most recent in November 2025. Liming Tsau ranks #189,202 of 4,157,543 US inventors in our database (top 4.6%). Patent records list Liming Tsau in Irvine, CA, US.

Issued Patents All Time

Showing 1–22 of 22 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12463319 Integrated antennas on side wall of 3D stacked die Sam Karikalan, Sam Ziqun Zhao, Mayank Mayukh, Dharmendra Saraswat, Arun Ramakrishnan +1 more 2025-11-04
12216153 Semiconductor product with edge integrity detection structure Xiaoming Li, Andy Brotman 2025-02-04
12191243 Cantilevered power planes to provide a return current path for high-speed signals Arun Ramakrishnan, Dharmendra Saraswat, Reza Sharifi, Sam Ziqun Zhao, Sam Karikalan +1 more 2025-01-07
12068232 Integrated circuit package with serpentine conductor and method of making Michael Yee-Chih Wang, Cheng-Chung Lee, Joon Lee, Reza Sharifi, Junfei Zhu 2024-08-20
11906802 Photonics integration in semiconductor packages Mayank Mayukh, Sam Ziqun Zhao, Sam Karikalan, Reza Sharifi, Arun Ramakrishnan +1 more 2024-02-20
11049829 Redistribution metal and under bump metal interconnect structures and method Sam Ziqun Zhao, Edward Law, Andy Brotman 2021-06-29
10629504 Die edge crack and delamination detection Ennis T. Ogawa, Yusang Lin 2020-04-21
10504862 Redistribution metal and under bump metal interconnect structures and method Sam Ziqun Zhao, Edward Law, Andy Brotman 2019-12-10
9741667 Integrated circuit with die edge assurance structure Rong Zeng 2017-08-22 $45,155,000
8106476 Semiconductor die with fuse window and a monitoring window over a structure which indicates fuse integrity Robert I. Wu, Robert Lutze, Jung Wang, Voon Yean Ten 2012-01-31 $4,697,000
7329955 Metal-insulator-metal (MIM) capacitor 2008-02-12 $11,672,000
7187015 High-density metal capacitor using dual-damascene copper interconnect 2007-03-06 $19,130,000
7049204 High density metal capacitor using via etch stopping layer as field dielectric in dual-damascence interconnect process 2006-05-23 $8,992,000
7009891 System and method for one-time programmed memory through direct-tunneling oxide breakdown Vincent Chen, Henry Chen, Jay Shiau, Surya Battacharya, Akira Ito 2006-03-07 $11,494,000
6985387 System and method for one-time programmed memory through direct-tunneling oxide breakdown Vincent Chen, Henry Chen, Jay Shiau, Surya Battacharya, Akira Ito 2006-01-10 $9,306,000
6960819 System and method for one-time programmed memory through direct-tunneling oxide breakdown Vincent Chen, Henry Chen, Jay Shiau, Surya Battacharya, Akira Ito 2005-11-01 $10,666,000
6952053 Metal bond pad for integrated circuits allowing improved probing ability of small pads Tzu-Hsin Huang, Vincent Chen 2005-10-04 $17,605,000
6950355 System and method to screen defect related reliability failures in CMOS SRAMS Surya Battacharya, Ming-Chung Chen, Guang-Jye Shiau, Henry Chen 2005-09-27 $13,989,000
6902972 High-density metal capacitor using dual-damascene copper interconnect 2005-06-07 $11,383,000
6833604 High density metal capacitor using dual-damascene copper interconnect 2004-12-21 $12,132,000
6803306 High density metal capacitor using via etch stopping layer as field dielectric in dual-damascence interconnect process 2004-10-12 $9,567,000
6417094 Dual-damascene interconnect structures and methods of fabricating same Bin Zhao 2002-07-09