Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7009891 | System and method for one-time programmed memory through direct-tunneling oxide breakdown | Vincent Chen, Henry Chen, Liming Tsau, Jay Shiau, Akira Ito | 2006-03-07 |
| 6985387 | System and method for one-time programmed memory through direct-tunneling oxide breakdown | Vincent Chen, Henry Chen, Liming Tsau, Jay Shiau, Akira Ito | 2006-01-10 |
| 6960819 | System and method for one-time programmed memory through direct-tunneling oxide breakdown | Vincent Chen, Henry Chen, Liming Tsau, Jay Shiau, Akira Ito | 2005-11-01 |
| 6950355 | System and method to screen defect related reliability failures in CMOS SRAMS | Ming-Chung Chen, Guang-Jye Shiau, Liming Tsau, Henry Chen | 2005-09-27 |