Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10241148 | Virtual access of input/output (I/O) for test via an on-chip star network | Ashfaq R. Shaikh, Wen-Hung Lo, Punit Kishore, Amit Sanghani | 2019-03-26 |
| 7797594 | Built-in self-test of 3-dimensional semiconductor memory arrays | Ishwardutt Parulkar, Sriram Anandakumar | 2010-09-14 |
| 7779316 | Method of testing memory array at operational speed using scan | Ishwardutt Parulkar, Gaurav Agarwal, Paul J. Dickinson | 2010-08-17 |
| 5625630 | Increasing testability by clock transformation | Miron Abramovici | 1997-04-29 |
| 5590135 | Testing a sequential circuit | Miron Abramovici, Vishwani D. Agrawal, Kwang-Ting Cheng | 1996-12-31 |