Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10073139 | Cycle deterministic functional testing of a chip with asynchronous clock domains | Ali Vahidsafa | 2018-09-11 |
| 8726114 | Testing of SRAMS | Ali Vahidsafa, Gaurav Agarwal | 2014-05-13 |
| 7797594 | Built-in self-test of 3-dimensional semiconductor memory arrays | Ishwardutt Parulkar, Krishna B. Rajan | 2010-09-14 |