SA

S. M. Masudur Rahman Al Arif

AB Asml Netherlands B.V.: 1 patents #2,025 of 3,192Top 65%
Overall (All Time): #2,405,642 of 4,157,543Top 60%
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Patent #TitleCo-InventorsDate
12276921 Substrate comprising a target arrangement, and associated at least one patterning device, lithographic method and metrology method Olger Victor Zwier, Maurits Van Der Schaar, Hilko Dirk Bos, Hans Van Der Laan, Henricus Wilhelmus Maria Van Buel +6 more 2025-04-15