Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8773657 | Method to determine the value of process parameters based on scatterometry data | Hans Van Der Laan, Hugo Augustinus Joseph Cramer, Antoine Gaston Marie Kiers | 2014-07-08 |
| 7199861 | Lithographic apparatus and device manufacturing method | Maurice Henricus Franciscus Janssen, Jan Bernard Plechelmus Van Schoot | 2007-04-03 |
| 6960775 | Lithographic apparatus, device manufacturing method and device manufactured thereby | Hans Van Der Laan | 2005-11-01 |