OM

Orion Jonathan Pierre Mouraille

AB Asml Netherlands B.V.: 4 patents #960 of 3,192Top 35%
📍 Eersel, NL: #9 of 43 inventorsTop 25%
Overall (All Time): #1,067,485 of 4,157,543Top 30%
4
Patents All Time

Issued Patents All Time

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
12189308 Method for adjusting a target feature in a model of a patterning process based on local electric fields Richard Johannes Franciscus Van Haren, Leon Paul VAN DIJK, Oktay Yildirim 2025-01-07
11619884 Method for adjusting a target feature in a model of a patterning process based on local electric fields Richard Johannes Franciscus Van Haren, Leon Paul VAN DIJK, Oktay Yildirim 2023-04-04
11294294 Alignment mark positioning in a lithographic process Richard Johannes Franciscus Van Haren, Leon Paul VAN DIJK, Anne Marie Pastol 2022-04-05
10775705 Patterning stack optimization Wim Tjibbo Tel, Jozef Maria Finders, Anton Bernhard Van Oosten 2020-09-15