Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11435673 | Method of determining a set of metrology points on a substrate, associated apparatus and computer program | Roy Werkman, Jochem Sebastiaan Wildenberg | 2022-09-06 |
| 10459354 | Lithographic apparatus and lithographic projection method | Bart Dinand Paarhuis, Jean-Philippe Xavier Van Damme, Johannes Onvlee, Cornelis Melchior BROUWER | 2019-10-29 |