Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8642235 | Method of optimizing a die size, method of designing a pattern device manufacturing method, and computer program product | Petar Veselinovic, Paul Jacques Van Wijnen | 2014-02-04 |
| 7112813 | Device inspection method and apparatus using an asymmetric marker | Arie Jeffrey Den Boef, Hugo Augustinus Joseph Cramer, Mircea Dusa, Richard Johannes Franciscus Van Haren, Antoine Gaston Marie Kiers +7 more | 2006-09-26 |
| 6297876 | Lithographic projection apparatus with an alignment system for aligning substrate on mask | — | 2001-10-02 |