DH

David A. Hult

AN Asml Holding N.V.: 5 patents #109 of 520Top 25%
AB Asml Netherlands B.V.: 1 patents #2,025 of 3,192Top 65%
SG Silicon Valley Group: 1 patents #31 of 97Top 35%
Overall (All Time): #866,913 of 4,157,543Top 25%
6
Patents All Time

Issued Patents All Time

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDate
8085383 System, method, and apparatus for scanning detector for fast and frequent illumination uniformity correction module 2011-12-27
8059266 Radiometric Kirk test Heine Melle Mulder, Minne Cuperus 2011-11-15
7714984 Residual pupil asymmetry compensator for a lithography scanner 2010-05-11
7525641 System and method for uniformity correction Richard Carl Zimmerman, Eric Brian Catey, Alexander Kremer, Heine Melle Mulder, Hendrikus Robertus Marie Van Greevenbroek +1 more 2009-04-28
7388647 Method and system for real time uniformity feedback 2008-06-17
6239863 Removable cover for protecting a reticle, system including and method of using the same Eric Brian Catey, Santiago del Puerto, Stephen Roux 2001-05-29