Issued Patents All Time
Showing 25 most recent of 38 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12416858 | Optical device with elements having outwardly-curved opposing leading edges spaced according to a duty cycle, pitch, and critical dimension | Jing Jiang | 2025-09-16 |
| 12398998 | Methods for high-resolution, stable measurement of pitch and orientation in optical gratings | Yangyang SUN, Ludovic Godet | 2025-08-26 |
| 12393025 | Waveguide combiners having arrangements for image uniformity | Ravi Kumar Komanduri | 2025-08-19 |
| 12386155 | Ultra-wide angle lens systems with external pupil | Wubin PANG, Yangyang SUN, Samarth Bhargava | 2025-08-12 |
| 12378662 | Ion implantation to modify glass locally for optical devices | Nai-Wen Pi, Kang Luo, Ludovic Godet | 2025-08-05 |
| 12379280 | Method of measuring efficiency for optical devices | Yangyang SUN, Kazuya Daito, Ludovic Godet | 2025-08-05 |
| 12249489 | Optical device improvement | Yue Chen, Jinyu LU, Yongmei Chen, Zihao Yang, Mingwei Zhu +6 more | 2025-03-11 |
| 12236575 | In-line metrology systems, apparatus, and methods for optical devices | Yangyang SUN, Kazuya Daito, Ludovic Godet | 2025-02-25 |
| 12229940 | In-line metrology systems, apparatus, and methods for optical devices | Yangyang SUN, Kazuya Daito, Ludovic Godet | 2025-02-18 |
| 12203747 | Interference in-sensitive Littrow system for optical device structure measurement | Yangyang SUN, Ludovic Godet | 2025-01-21 |
| 12165341 | Optical resolution measurement method for optical devices | Yangyang SUN, Ludovic Godet | 2024-12-10 |
| 12159392 | Die system and method of comparing alignment vectors | Yongan Xu, Chan Juan XING, Yifei Wang, Ludovic Godet | 2024-12-03 |
| 12153344 | Lithography method to form structures with slanted angle | Yongan Xu, Jhenghan YANG, Ludovic Godet | 2024-11-26 |
| 12140494 | Method to measure light loss of optical films and optical substrates | Kang Luo, Fariah Hayee, Ludovic Godet | 2024-11-12 |
| 12085475 | Method to determine line angle and rotation of multiple patterning | Yongan Xu, Chan Juan XING, Ludovic Godet | 2024-09-10 |
| 12050327 | Imaging system and method of manufacturing a metalens array | Tapashree Roy, Ludovic Godet, Wayne MCMILLAN, Robert Jan Visser | 2024-07-30 |
| 12019242 | Full-field metrology tool for waveguide combiners and meta-surfaces | Yangyang SUN, Ludovic Godet | 2024-06-25 |
| 12021102 | Imaging system and method of creating composite images | Yongan Xu, Ludovic Godet, Naamah ARGAMAN, Robert Jan Visser | 2024-06-25 |
| 12003841 | Edge inspection system for inspection of optical devices | Michael David-Scott Kemp | 2024-06-04 |
| 11988574 | Illumination system for AR metrology tool | Yangyang SUN, Kazuya Daito, Ludovic Godet | 2024-05-21 |
| 11978196 | See-through metrology systems, apparatus, and methods for optical devices | Yangyang SUN, Kazuya Daito, Ludovic Godet | 2024-05-07 |
| 11913776 | Interference in-sensitive Littrow system for optical device structure measurement | Yangyang SUN, Ludovic Godet | 2024-02-27 |
| 11892367 | Method to measure light loss of optical films and optical substrates | Kang Luo, Fariah Hayee, Ludovic Godet | 2024-02-06 |
| 11873554 | Ion implantation to modify glass locally for optical devices | Nai-Wen Pi, Kang Luo, Ludovic Godet | 2024-01-16 |
| 11851740 | PVD directional deposition for encapsulation | Ludovic Godet, Bencherki Mebarki | 2023-12-26 |