Issued Patents All Time
Showing 26–38 of 38 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11802791 | Optical device metrology systems and related methods | Kazuya Daito, Ludovic Godet | 2023-10-31 |
| 11754919 | Lithography method to form structures with slanted angle | Yongan Xu, Jhenghan YANG, Ludovic Godet | 2023-09-12 |
| 11748875 | See-through metrology systems, apparatus, and methods for optical devices | Yangyang SUN, Kazuya Daito, Ludovic Godet | 2023-09-05 |
| 11610925 | Imaging system and method of creating composite images | Yongan Xu, Ludovic Godet, Naamah ARGAMAN, Robert Jan Visser | 2023-03-21 |
| 11565489 | Wetting layers for optical device enhancement | Karl J. Armstrong, Wilson Banez | 2023-01-31 |
| 11512385 | Method of forming gratings | Joseph C. Olson, Ludovic Godet, Rutger Meyer Timmerman Thijssen, Morgan Evans | 2022-11-29 |
| 11473191 | Method for creating a dielectric filled nanostructured silica substrate for flat optical devices | Tapashree Roy, Rutger Meyer Timmerman Thijssen, Ludovic Godet | 2022-10-18 |
| 11193198 | Methods of forming devices on a substrate | Joseph C. Olson, Ludovic Godet, Rutger Meyer Timmerman Thijssen, Morgan Evans | 2021-12-07 |
| 11029206 | Methods and apparatus for waveguide metrology | Rutger Meyer Timmerman Thijssen, Ludovic Godet | 2021-06-08 |
| 11008647 | PVD titanium dioxide formation using sputter etch to halt onset of crystalinity in thick films | Karl J. Armstrong | 2021-05-18 |
| 10921721 | Measurement system and grating pattern array | Yifei Wang, Yongan Xu, Ludovic Godet | 2021-02-16 |
| 10801890 | Measurement system and a method of diffracting light | Yifei Wang, Ian McMackin, Rutger Meyer Timmerman Thijssen, Ludovic Godet | 2020-10-13 |
| 10705268 | Gap fill of imprinted structure with spin coated high refractive index material for optical components | Ludovic Godet, Wayne MCMILLAN | 2020-07-07 |