Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11651509 | Method, system and computer program product for 3D-NAND CDSEM metrology | Roman Kris, Roi Meir, Sahar LEVIN, Ishai Schwarzband, Grigory Klebanov +6 more | 2023-05-16 |
| 9824852 | CD-SEM technique for wafers fabrication control | Roman Kris, Yakov Weinberg, Yan Ivanchenko, Ishai Schwarzband, Dan Lange +3 more | 2017-11-21 |