Issued Patents All Time
Showing 25 most recent of 52 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7748944 | Method and apparatus for semiconductor processing | JB Price, Jed Keller, Laurence Dulmage | 2010-07-06 |
| 7140359 | Spark plug capable of removing remaining electric charges | — | 2006-11-28 |
| 6917358 | Resistance inducting wire layout on a touch panel | — | 2005-07-12 |
| 6788079 | Indexing multiple test probe system and method | — | 2004-09-07 |
| 6653853 | Multiple test probe system and method | — | 2003-11-25 |
| 6454519 | Dual cassette load lock | Masato Toshima, Phil Salzman, Steven Murdoch, Cheng Wang, Mark A. Stenholm +2 more | 2002-09-24 |
| 6366103 | Multiple test probe system | — | 2002-04-02 |
| 6280581 | Method and apparatus for electroplating films on semiconductor wafers | — | 2001-08-28 |
| 6249342 | Method and apparatus for handling and testing wafers | — | 2001-06-19 |
| 6164894 | Method and apparatus for integrated wafer handling and testing | — | 2000-12-26 |
| 6154041 | Method and apparatus for measuring thickness of semiconductor substrates | — | 2000-11-28 |
| 6053688 | Method and apparatus for loading and unloading wafers from a wafer carrier | — | 2000-04-25 |
| 5917191 | Apparatus for measuring surface topography | — | 1999-06-29 |
| 5914611 | Method and apparatus for measuring sheet resistance and thickness of thin films and substrates | — | 1999-06-22 |
| 5882165 | Multiple chamber integrated process system | Dan Maydan, Sasson Somekh, David N. Wang, Masato Toshima, Isaac Harari +1 more | 1999-03-16 |
| 5851299 | Passive shield for CVD wafer processing which provides frontside edge exclusion and prevents backside depositions | Mei Chang | 1998-12-22 |
| 5769588 | Dual cassette load lock | Masato Toshima, Phil Salzman, Steven Murdoch, Cheng Wang, Mark A. Stenholm +2 more | 1998-06-23 |
| 5708279 | Method and apparatus for measuring surface topography | — | 1998-01-13 |
| 5696383 | Method and apparatus for measuring the curvature of wafers with beams of different wavelengths | — | 1997-12-09 |
| 5691648 | Method and apparatus for measuring sheet resistance and thickness of thin films and substrates | — | 1997-11-25 |
| 5670888 | Method for transporting and testing wafers | — | 1997-09-23 |
| 5546179 | Method and apparatus for mapping the edge and other characteristics of a workpiece | — | 1996-08-13 |
| 5532499 | Beam spot position detector having a detector moving mechanism | — | 1996-07-02 |
| 5523582 | Method and apparatus for measuring the curvature of wafers with a laser source selecting device | — | 1996-06-04 |
| 5495178 | Method and apparatus for measuring film thickness | — | 1996-02-27 |