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David Cheng — 52 Patents

Applied Materials: 19 patents #703 of 7,310Top 10%
UNUnknown: 11 patents #718 of 83,584Top 1%
Xerox: 3 patents #3,111 of 8,622Top 40%
CACrossing Automation: 1 patents #6 of 10Top 60%
CMCurators Of The University Of Missouri: 1 patents #512 of 1,157Top 45%
San Jose, CA: #914 of 32,062 inventorsTop 3%
California: #7,530 of 386,348 inventorsTop 2%
Overall (All Time): #50,240 of 4,157,543Top 2%
52 Patents All Time
David Cheng has been granted 52 US patents while listed as an inventor at Applied Materials. The first was granted in 1983 and the most recent in July 2010. David Cheng ranks #50,240 of 4,157,543 US inventors in our database (top 1.2%). Patent records list David Cheng in San Jose, CA, US.

Issued Patents All Time

Showing 1–25 of 52 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
7748944 Method and apparatus for semiconductor processing JB Price, Jed Keller, Laurence Dulmage 2010-07-06
7140359 Spark plug capable of removing remaining electric charges — 2006-11-28
6917358 Resistance inducting wire layout on a touch panel — 2005-07-12
6788079 Indexing multiple test probe system and method — 2004-09-07
6653853 Multiple test probe system and method — 2003-11-25
6454519 Dual cassette load lock Masato Toshima, Phil Salzman, Steven Murdoch, Cheng Wang, Mark A. Stenholm +2 more 2002-09-24 $13,765,000
6366103 Multiple test probe system — 2002-04-02
6280581 Method and apparatus for electroplating films on semiconductor wafers — 2001-08-28
6249342 Method and apparatus for handling and testing wafers — 2001-06-19
6164894 Method and apparatus for integrated wafer handling and testing — 2000-12-26
6154041 Method and apparatus for measuring thickness of semiconductor substrates — 2000-11-28
6053688 Method and apparatus for loading and unloading wafers from a wafer carrier — 2000-04-25
5917191 Apparatus for measuring surface topography — 1999-06-29
5914611 Method and apparatus for measuring sheet resistance and thickness of thin films and substrates — 1999-06-22
5882165 Multiple chamber integrated process system Dan Maydan, Sasson Somekh, David N. Wang, Masato Toshima, Isaac Harari +1 more 1999-03-16 $34,969,000
5851299 Passive shield for CVD wafer processing which provides frontside edge exclusion and prevents backside depositions Mei Chang 1998-12-22 $39,449,000
5769588 Dual cassette load lock Masato Toshima, Phil Salzman, Steven Murdoch, Cheng Wang, Mark A. Stenholm +2 more 1998-06-23 $66,533,000
5708279 Method and apparatus for measuring surface topography — 1998-01-13
5696383 Method and apparatus for measuring the curvature of wafers with beams of different wavelengths — 1997-12-09
5691648 Method and apparatus for measuring sheet resistance and thickness of thin films and substrates — 1997-11-25
5670888 Method for transporting and testing wafers — 1997-09-23
5546179 Method and apparatus for mapping the edge and other characteristics of a workpiece — 1996-08-13
5532499 Beam spot position detector having a detector moving mechanism — 1996-07-02
5523582 Method and apparatus for measuring the curvature of wafers with a laser source selecting device — 1996-06-04
5495178 Method and apparatus for measuring film thickness — 1996-02-27

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Sungbum Kim52
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Katherine Morgenroth52
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Serg Bell52
Masahiro Nakagawa52
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