| 7947980 |
Non-volatile memory cell with charge storage element and method of programming |
Shahin Toutounchi, James Karp, Jeongheon Jeong, Michael J. Hart |
2011-05-24 |
$3,523,000 |
| 7687797 |
Three-terminal non-volatile memory element with hybrid gate dielectric |
James Karp, Daniel Gitlin, Shahin Toutounchi, Jongheon Jeong |
2010-03-30 |
$14,323,000 |
| 7544968 |
Non-volatile memory cell with charge storage element and method of programming |
Shahin Toutounchi, James Karp, Jongheon Jeong, Michael J. Hart |
2009-06-09 |
$6,153,000 |
| 7450431 |
PMOS three-terminal non-volatile memory element and method of programming |
James Karp, Jongheon Jeong, Shahin Toutounchi |
2008-11-11 |
$3,775,000 |
| 7420842 |
Method of programming a three-terminal non-volatile memory element using source-drain bias |
Shahin Toutounchi, James Karp, Jongheon Jeong |
2008-09-02 |
$7,129,000 |
| 6687157 |
Circuits and methods for identifying a defective memory cell via first, second and third wordline voltages |
Ping-Chen Liu, Kenneth Miu |
2004-02-03 |
$23,056,000 |
| 6525973 |
Automatic bitline-latch loading for flash prom test |
Farshid Shokouhi |
2003-02-25 |
$13,505,000 |
| 6388946 |
Circuit and method for incrementally selecting word lines |
Phillip H. McGibney |
2002-05-14 |
$67,185,000 |
| 6285584 |
Method to implement flash memory |
Anders T. Dejenfelt, Qi Lin, Robert Olah |
2001-09-04 |
$118,670,000 |
| 6272060 |
Shift register clock scheme |
Ben Sheen |
2001-08-07 |
$124,112,000 |
| 6249458 |
Switching circuit for transference of multiple negative voltages |
Farshid Shokouhi, Ben Sheen |
2001-06-19 |
$259,092,000 |
| 6233177 |
Bitline latch switching circuit for floating gate memory device requiring zero volt programming voltage |
Farshid Shokouhi |
2001-05-15 |
$67,094,000 |
| 6212103 |
Method for operating flash memory |
Anders T. Dejenfelt, Qi Lin, Robert Olah |
2001-04-03 |
$69,974,000 |
| 6112322 |
Circuit and method for stress testing EEPROMS |
Phillip H. McGibney |
2000-08-29 |
$446,539,000 |
| 5671234 |
Programmable input/output buffer circuit with test capability |
Christopher E. Phillips, Joseph G. Nolan, III, Laurence H. Cooke |
1997-09-23 |
|
| 5652527 |
Input-output circuit for increasing immunity to voltage spikes |
Christopher E. Phillips, Joseph G. Nolan, III, Laurence H. Cooke |
1997-07-29 |
|
| 5629636 |
Ram-logic tile for field programmable gate arrays |
— |
1997-05-13 |
|
| 5534798 |
Multiplexer with level shift capabilities |
Christopher E. Phillips, Joseph G. Nolan, III, Laurence H. Cooke |
1996-07-09 |
|
| 5465055 |
RAM-logic tile for field programmable gate arrays |
— |
1995-11-07 |
|
| 5453696 |
Embedded fuse resistance measuring circuit |
William R. Becker |
1995-09-26 |
|
| 5299150 |
Circuit for preventing false programming of anti-fuse elements |
Douglas C. Galbraith, Esmat Z. Hamdy, Abdelshafy A. Eltoukhy |
1994-03-29 |
$3,193,000 |
| 5286992 |
Low voltage device in a high voltage substrate |
Douglas C. Galbraith, Abdelshafy A. Eltoukhy |
1994-02-15 |
$3,163,000 |
| 5221865 |
Programmable input/output buffer circuit with test capability |
Christopher E. Phillips, Joseph G. Nolan, III, Laurence H. Cooke |
1993-06-22 |
|
| 4918341 |
High speed static single-ended sense amplifier |
Douglas C. Galbraith |
1990-04-17 |
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