DW

Dennis L. Wendell

AM AMD: 14 patents #820 of 9,279Top 9%
Oracle: 9 patents #1,297 of 14,854Top 9%
NS National Semiconductor: 8 patents #229 of 2,238Top 15%
IN Intel: 1 patents #18,218 of 30,777Top 60%
Overall (All Time): #108,274 of 4,157,543Top 3%
33
Patents All Time

Issued Patents All Time

Showing 25 most recent of 33 patents

Patent #TitleCo-InventorsDate
9627038 Multiport memory cell having improved density area 2017-04-18
7952910 Memory device with split power switch Yolin Lih, Jun Liu, Daniel Fung, Ajay Bhatia, Shyam Balasubramanian 2011-05-31
7869263 Elastic power for read margin Yolin Lih, Ajay Bhatia, Jun Liu, Daniel Fung, Shyam Balasubramanian 2011-01-11
7834663 NAND/NOR registers 2010-11-16
7672187 Elastic power for read and write margins Yolin Lih, Ajay Bhatia, Jun Liu, Daniel Fung, Shyam Balasubramanian 2010-03-02
7254746 Method and apparatus for using a fault tolerant memory in processor testing and design Pradeep Kaushik 2007-08-07
7134057 Off-pitch column redundancy using dynamic shifters Pradeep Kaushik, Suresh Seshadri 2006-11-07
7084671 Sense amplifier and method for making the same Howard Levy, Jin-Uk Shin 2006-08-01
7075840 Low impedance memory bitline eliminating precharge 2006-07-11
6058447 Handshake circuit and operating method for self-resetting circuits John C. Holst 2000-05-02
6018253 Register with current-steering input network 2000-01-25
5986490 Amplifier-based flip-flop elements Yi-Ren Hwang, Hamid Partovi 1999-11-16
5983346 Power-up initialization circuit that operates robustly over a wide range of power-up rates 1999-11-09
5959468 Buffer for static in/static out dynamic speed Effendy Kumala 1999-09-28
5958075 Efficient on-pitch scannable sense amplifier 1999-09-28
5936892 Memory cell DC characterization apparatus and method 1999-08-10
5930185 Data retention test for static memory cell 1999-07-27
5923601 Memory array sense amplifier test and characterization 1999-07-13
5920517 Memory array test and characterization using isolated memory cell power supply 1999-07-06
5920515 Register-based redundancy circuit and method for built-in self-repair in a semiconductor memory device Imtiaz P. Shaik, Benjamin Wong, John C. Holst, Donald A. Draper, Amos Ben-Meir +1 more 1999-07-06
5915084 Scannable sense amplifier circuit 1999-06-22
5883841 Selective bit line recovery in a memory array 1999-03-16
5883826 Memory block select using multiple word lines to address a single memory cell row John C. Holst 1999-03-16
5841712 Dual comparator circuit and method for selecting between normal and redundant decode logic in a semiconductor memory device Benjamin Wong 1998-11-24
5430399 Reset logic circuit and method 1995-07-04