Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5920515 | Register-based redundancy circuit and method for built-in self-repair in a semiconductor memory device | Dennis L. Wendell, Benjamin Wong, John C. Holst, Donald A. Draper, Amos Ben-Meir +1 more | 1999-07-06 |
| 5422891 | Robust delay fault built-in self-testing method and apparatus | Michael L. Bushnell | 1995-06-06 |