Issued Patents All Time
Showing 26–50 of 105 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9213835 | Method and integrated circuit for secure encryption and decryption | Stephen M. Trimberger | 2015-12-15 |
| 9003221 | Skew compensation for a stacked die | Khaldoon S. Abugharbieh, Daniel J. Ferris, III, Loren Jones | 2015-04-07 |
| 8981810 | Method and apparatus for preventing accelerated aging of a physically unclonable function | Stephen M. Trimberger | 2015-03-17 |
| 8773929 | Single-event-upset resistant memory cell with triple well | — | 2014-07-08 |
| 8595442 | Redundantly validating values with a processor and a check circuit | Philip B. James-Roxby | 2013-11-26 |
| 8549379 | Classifying a criticality of a soft error and mitigating the soft error based on the criticality | Alfred L. Rodriguez, Nicholas J. Possley, Kevin Boshears, Jameel Hussein | 2013-10-01 |
| 8522052 | Method and integrated circuit for secure encryption and decryption | — | 2013-08-27 |
| 8516339 | Method of and circuit for correcting adjacent bit errors in a memory | Stephen M. Trimberger | 2013-08-20 |
| 8476601 | Identifying an atomic element using an integrated circuit | Joseph J. Fabula, Raymond J. Matteis | 2013-07-02 |
| 8407653 | Method and system of estimating a derating factor for soft errors in a circuit | Paul R. Schumacher | 2013-03-26 |
| 8397191 | Determining failure rate from circuit design layouts | — | 2013-03-12 |
| 8386990 | Unique identifier derived from an intrinsic characteristic of an integrated circuit | Stephen M. Trimberger | 2013-02-26 |
| 8375338 | Estimating the rate of storage corruption from atomic particles | Jameel Hussein, Kenneth D. Chapman, Ching Yee Hu | 2013-02-12 |
| 8155907 | Methods of enabling functions of a design to be implemented in an integrated circuit device and a computer program product | Stephen M. Trimberger, Christopher H. Kingsley, Satyaki Das, Tim Tuan | 2012-04-10 |
| 8146028 | Duplicate design flow for mitigation of soft errors in IC operation | — | 2012-03-27 |
| 8117497 | Method and apparatus for error upset detection and correction | — | 2012-02-14 |
| 8014184 | Radiation hardened memory cell | — | 2011-09-06 |
| 7979827 | Device having programmable resources and a method of configuring a device having programmable resources | Stephen M. Trimberger | 2011-07-12 |
| 7944769 | System for power-on detection | — | 2011-05-17 |
| 7852108 | Single event upset resilient programmable interconnect | — | 2010-12-14 |
| 7831873 | Method and apparatus for detecting sudden temperature/voltage changes in integrated circuits | Stephen M. Trimberger | 2010-11-09 |
| 7795900 | Memory array with multiple-event-upset hardening | Tan C. Hoang | 2010-09-14 |
| 7763861 | Determining a characteristic of atomic particles affecting a programmable logic device | Nathan Bialke, Michael A. Margolese, Raymond J. Matteis | 2010-07-27 |
| 7759801 | Tapered signal lines | Peter H. Alfke | 2010-07-20 |
| 7739565 | Detecting corruption of configuration data of a programmable logic device | — | 2010-06-15 |