Issued Patents All Time
Showing 26–50 of 59 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8963233 | Power MOSFET device structure for high frequency applications | Anup Bhalla, Daniel Ng, Sik Lui | 2015-02-24 |
| 8884406 | Etch depth determination structure | Yingying Lou, Yu Wang, Anup Bhalla | 2014-11-11 |
| 8735968 | Integrated MOSFET devices with Schottky diodes and associated methods of manufacturing | Lei Zhang | 2014-05-27 |
| 8735973 | Trench-gate MOSFET device and method for making the same | Lei Zhang, Donald R. Disney, Rongyao Ma | 2014-05-27 |
| 8723178 | Integrated field effect transistors with high voltage drain sensing | — | 2014-05-13 |
| 8716784 | Semiconductor device and associated fabrication method | Lei Zhang | 2014-05-06 |
| 8680614 | Split trench-gate MOSFET with integrated Schottky diode | Rongyao Ma, Lei Zhang | 2014-03-25 |
| 8597998 | Power MOS device fabrication | Anup Bhalla, Sik Lui | 2013-12-03 |
| 8546879 | High density lateral DMOS with recessed source contact | Donald R. Disney, Lei Zhang | 2013-10-01 |
| 8525260 | Super junction device with deep trench and implant | Michael Hsing, Deming Xiao | 2013-09-03 |
| 8471368 | Polysilicon control etch back indicator | Yu Wang, Sung-Shan Tai, Hong Chang | 2013-06-25 |
| 8288229 | Power MOS device fabrication | Anup Bhalla, Sik Lui | 2012-10-16 |
| 8193061 | Polysilicon control etch-back indicator | Yu Wang, Sung-Shan Tai, Hong Chang | 2012-06-05 |
| 8169801 | Voltage converters with integrated low power leaker device and associated methods | Michael Hsing, Ognjen Milic | 2012-05-01 |
| 8163618 | Power MOSFET device structure for high frequency applications | Anup Bhalla, Daniel Ng, Sik Lui | 2012-04-24 |
| 8021563 | Etch depth determination for SGT technology | Yingying Lou, Yu Wang, Anup Bhalla | 2011-09-20 |
| 8008151 | Shallow source MOSFET | Sung-Shan Tai, Anup Bhalla, Hong Chang, Moses Ho | 2011-08-30 |
| 7977193 | Trench-gate MOSFET with capacitively depleted drift region | Donald R. Disney, Lei Zhang | 2011-07-12 |
| 7932148 | Processes for manufacturing MOSFET devices with excessive round-hole shielded gate trench (SGT) | Hong Chang, Sung-Shan Tai, Yu Wang | 2011-04-26 |
| 7928507 | Polysilicon control etch-back indicator | Yu Wang, Sung-Shan Tai, Hong Chang | 2011-04-19 |
| 7923774 | Power MOS device with conductive contact layer | Anup Bhalla, Sik Lui | 2011-04-12 |
| 7879676 | High density trench mosfet with single mask pre-defined gate and contact trenches | Yeeheng Lee, Hong Chang, John Chen, Anup Bhalla | 2011-02-01 |
| 7875541 | Shallow source MOSFET | Sung-Shan Tai, Anup Bhalla, Hong Chang, Moses Ho | 2011-01-25 |
| 7800169 | Power MOS device | Anup Bhalla, Sik Lui | 2010-09-21 |
| 7795108 | Resistance-based etch depth determination for SGT technology | Yu Wang, Yingying Lou, Anup Bhalla | 2010-09-14 |